循环伏安法在玻碳上电沉积金纳米颗粒:在痕量汞分析中的应用( Gold nanoparticles electrodeposited on glassy carbon using cyclic voltammetry: Application to Hg(II) trace analysis )

T Hezard K Fajerwerg D Evrard V Collière P Behra P Gros Experimental/ electrochemical electrodes electrochemistry field emission electron microscopy gold mercury (metal) nanofabrication nanoparticles reduction (chemical) scanning electron microscopy voltammetry (chemical analysis)/ electrodeposition cyclic voltammetry mercury(II) trace analysis electrochemical property gold nanoparticles-modified glassy carbon electrode electroreduction cyclic potential scans field emission gun scanning electron microscopy FEG-SEM square wave anodic stripping voltammetry SWASV physicochemical properties size 36 nm Au-C Hg/ A8116 Methods of nanofabrication and processing A8245 Electrochemistry and electrophoresis A8280F Electrochemical analytical methods A6146 Structure of solid clusters, nanoparticles, nanotubes and nanostructured materials/ size 3.6E-08 m/ Au-C/int Au/int C/int Au/el C/el Hg/el

介绍了金纳米粒子修饰玻碳电极（AUNPS-GC）测定痕量汞的方法。从NaNO3中的HAUCl4开始，利用循环伏安法(CV)在玻碳电极上沉积了金纳米粒子（AuNPs）。根据循环电位扫描次数(N)，通过改变整个电还原步骤中消耗的总电荷，可以获得不同的镀层。用H2SO4中的CV和场发射枪扫描电镜（FEG-SEM）表征了AuNPs与电荷的关系。用方波阳极溶出伏安法(SWASV)测定了AUNPS-GC电极的低汞浓度。与未修饰的气相色谱和裸金电极相比，AUNPS-GC电极在汞(II)的测定上有明显的改善。结果表明，AUNPS-GC电极的Hg(II)测定性能与镀层的物理化学性质有关。四次电沉积循环扫描的结果最好，获得了小粒径(36±13nm)和高密度（73粒子μm2)的粒子。在此条件下，线性范围为0.64～4.00nM，检出限为0.42nM。

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